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X-ray observation device - List of Manufacturers, Suppliers, Companies and Products

X-ray observation device Product List

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X-ray observation device 'FX-300tR2'

X-ray observation device 'FX-300tR2'

Compact yet achieving a geometric magnification of 900 times! A cost-effective X-ray observation device!

This product is a cost-effective X-ray observation device that achieves a geometric magnification of 900 times while being compact. You can register good quality images and compare them with current images, and it is possible to observe with the flat panel tilted at 60°. Target to sample distance is 0.5mm, target to X-ray camera distance is 450mm: 450/0.5=900. The L-size device is compatible with substrates of 600×600mm. 【Features】 ■ Equipped with various measurement functions ■ Ability to register good quality images and compare them with current images ■ Flat panel can be tilted at 60° for observation ■ Automatic tracking of observation position for diagonal observation (points do not shift even if the camera is tilted) ■ Inspection functions can be added as an option ■ CT function and L-size compatibility can be added as options *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment

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X-ray observation device 'FX-500tRX/LL'

X-ray observation device 'FX-500tRX/LL'

High output 130kV, 300uA can also penetrate metal substrates! Suitable for solder inspection machines for 3-layer and 4-layer power devices.

The "FX-500tRX" is an X-ray observation device that uses the "X-ray stereo CT method" to individually inspect the solder joints under the bus bar, under the power chip, and under the insulating substrate of power devices. When using the conventional principle of X-ray transmission, the solder joints under the chip and under the insulating substrate appear in the same position, causing the front and back to overlap, which prevents accurate inspection. The X-ray stereo method is a groundbreaking inspection device that allows for the separation and individual inspection of each solder joint. 【Features】 ■ High-output X-ray source of 130kV and 300uA capable of penetrating 5mm copper plates ■ Ultra-long life 1.3 million pixel X-ray flat panel significantly reduces running costs ■ Separation of the front and back surfaces of the mounted board using the X-ray stereo method (approximately 4 seconds) ■ Acquisition of 300 layers of horizontal cross-sections of the mounted board using the X-ray stereo CT method (approximately 50 seconds) ■ Automatic inspection using CT functionality (OK/NG judgment) *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment

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X-ray observation device "IX-1610"

X-ray observation device "IX-1610"

X-ray observation device for analysis with a high resolution of 0.25 μm focal spot size.

The IX-1610 is an X-ray observation device equipped with defect analysis capabilities, featuring world-class X-ray resolution. By adopting an X-ray tube with the world's smallest focal spot size of 0.25μm, it achieves high resolution. With six-axis control, it enables high-function observation and automatic inspection. 【Features】 ■ Uses a 160kV, 0.2mA, 0.25μm open-type micro-focus X-ray tube ■ X-ray geometric magnification: 1,200 times ■ Employs a transmission-type target ■ Uses a 2.8 million pixel X-ray digital I.I. tube ■ Employs a transmission-type target *For more details, please refer to the catalog or feel free to contact us.

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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X-ray observation device 'LX-1610'

X-ray observation device 'LX-1610'

The world's smallest class of X-ray focal dimensions! High-function observation and automatic inspection are possible with 6-axis control.

This product is an analytical X-ray observation device with a high resolution of 0.25μm X-ray focal size. It uses a 160kV, 0.2mA, open-type micro-focus X-ray tube and a transmission-type target. With 6-axis control, it enables high-function observation and automatic inspection. 【Features】 ■ 160kV, 0.2mA, open-type ■ Uses a micro-focus X-ray tube ■ One of the smallest X-ray focal sizes in the world (0.25μm) ■ X-ray magnification: 2,000 times ■ Uses a transmission-type target ■ Equipped with a 2.8 million pixel X-ray digital I.I. tube *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment

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X-ray observation device 'FX-300tR2'

X-ray observation device 'FX-300tR2'

Compact yet achieving a geometric magnification of 900 times! A cost-effective X-ray observation device.

The "FX-300tR2" is an X-ray observation device that allows for the comparison and observation of current images against registered good quality images. Despite being a compact and small X-ray device, it achieves a geometric magnification of 900 times. The flat panel can be tilted at 60° for observation, and it automatically follows the observation position for diagonal viewing. It achieves a real resolution of 5μm, and the L-size device can accommodate substrates of 600×600. 【Features】 ■ Geometric magnification: 900 times ■ Monitor magnification: 5,400 times ■ X-ray output: 90kV ■ X-ray focal diameter: 5μ, 15μ (switchable) *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray inspection equipment

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X-ray observation device 'FX-400tRX/LL'

X-ray observation device 'FX-400tRX/LL'

It is a sealed X-ray device that achieves a high resolution of 2μm! A 3D X-ray stereo observation device.

The "FX-400tRX/LL" is an X-ray observation device that enables the acquisition of clear X-ray images with a high resolution of 2μm and a geometric magnification of 500 times. It can inspect the connection points of IC wire bonding and copper wires, as well as observe through-holes inside printed circuit boards. Additionally, with a high output of 110kV and 200μA, it is now possible to penetrate materials such as 3mm thick copper plates. 【Features】 ■ High output X-ray source of 110kV and 200μA allows penetration of copper plates (3mm) ■ High resolution image acquisition of fine details with a resolution of 2μm ■ High magnification imaging with a geometric magnification of 500 times ■ X-ray stereo method allows separation of the surface and back side of the mounted board (approximately 4 seconds) ■ X-ray stereo CT method enables acquisition of 300 horizontal cross-sections of the mounted board (approximately 50 seconds) *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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